IST 8920/8910 DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER
A Complete and Cost Effective Automated Test Equipment (ATE) System
for Testing of Discrete Semiconductor Components from mW to kW
HIGH POWER SEMICONDUCTOR TESTING
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions. Equipped with a Constant Temperature source, the 8900 series is able to heat devices up to 250°C to introduce thermal stress and allow devices to be tested at their normal operating temperatures so that failing devices can be detected earlier and before they become a serious problem.
The comprehensive 8920 model supports high power ON-state parameter testing for Vce(sat), Vds(on), Rds(on), Vsd, Vf, and Vtm at force currents of 400 A, 800 A, 1,600 A, 2,400 A, 3,200 A and 4,800 A.
Force voltages for Off-state parameter testing of Breakdown Voltage and Leakage Current measurements can be set to 2.5 KV, 5 KV, 7.5 KV or 10 KV.
AVAILABLE IN TWO MODELS TO FIT YOUR BUDGET AND TESTING NEEDS
The IST 8900 series test systems are available as a lower cost model in the 8910 and as a comprehensive model in the 8920. Both systems have identical parameter testing capabilities, but the 8920 is larger and can perform testing up to 4800 A / 10 KV. The 8910 (shown on right) is more compact and can test up to 50 A / 2.5 KV.
Features
- Test 137 parameters and 12 different semiconductor devices
- User friendly interface powered by a Windows 7 touch screen PC
- Auto-calibration and self-test diagnostics
- Curve tracer program built-in
- USB Printer interface for printing test reports
- Provides accurate Kelvin or self-calibrated Non-Kelvin testing options
- Constant temperature controller heats DUTs up to 250 oC
- Stores and recalls previous test programs
- Provides automatic Go/No Go tests or parametric measurements
- Handler interface for wafer or package level production testing
- Start-up safety check prevents testing on defective, incorrect DUTs, test heads, or pin-outs
- Adjustable pulsing test from 10 uS to 300 uS
- Measures junction capacitances and input impedance of MOSFETs and IGBTs
- Optional 6-1 IGBT module testing
- Safety Start test mode to protect user from accidental test starts
- Fixtures available for easier testing of module packages
- Slide-out hardware cabinet for ease of servicing.
Highlights of the 8900 Series
Curve Tracer
The IST 8900 Series is powered by a touch screen PC with Curve Tracer testing software preinstalled. Using the Curve Tracer application, the 8910/8920 is able to generate a single curve or as many as six curves per test cycle. Each curve is plotted from up to 32 different measurements taken by the tester within a test range specified by the user. The data increments can be set for either linear or logarithmic format. The resulting graph shows a precise operating point for a device under a set of changing conditions.
HIGH POWER CONSTANT CURRENT WITH RELAY ASSEMBLY
The 8920 features a high power constant current source that supplies up to 48 units of a 50 A or 100 A current source in parallel, enabling automated high current, high voltage power device testing.
KELVIN TEST FIXTURES FOR HIGH POWER TESTING
The IST 8920 includes specialized test fixtures that make it easy to setup and measure high power devices such as IGBTs, MOSFETs, Transistors, GTOs, SCRs, and Diodes. The test fixtures provide error-free testing while eliminating time consuming setups needed to secure test leads and sources. Using the test fixtures, testing can be performed at currents up to 4800 A and at voltages up to 10 KV.
SWITCHING EFFICIENCY ANALYSIS IN POWER IGBTs & MOSFETs
At low frequencies, conduction loss is the primary driver of power loss in a device and their performance can be assessed by measuring the DC parameters of Vce(sat), Vds(on), and Rds(on). At higher frequencies, the Cies, Coes, and Cres parameters and the device’s input impedance dictate the switching and driving loss.
Devices with heavy power loss will generate excess heat, leading to premature aging of the device and poor performance. The IST 8900 Series is a complete solution that is able to properly test high power devices as part of maintenance and production routines to ensure optimal performance and longevity of power devices used in today’s high frequency switching applications.
ACCESSORIES
POWER MODULE TEST FIXTURE W/TEMPERATURE CONTROL
SUPER HIGH POWER RELAY
IGBT 6-1 Decoder
HOT PLATE STAND w/TEMPERATURE CONTROL
