Icon Information Scan Technology

IST-6500 Specifications Sheet

GENERAL TECHNICAL SPECS

ACCESS TIME MEASUREMENT

Range: 2ns to 160ns with 2ns increments
Mode:
SRAM (1) Access time from chip enable (Tace)
     (2) Access time from address (Taa)
DRAM: (1) Access time from RAS/ (Trac)
     (2) Access time from CAS/ (Tcac)
     (3) Access time from column address (Taa)

DRAM TIMING CONTROL

Timing Programmable Range:
RAS/ to Column Address (Trad): 1ns to 39ns with 1ns resolution
RAS/ to CAS/ (Trcd): 1ns to 99 ns with 1ns resolution
Min. Cycle Time (trc): 150ns

DRAM OPERATION MODE

(1) Early Write Mode
@ (Twcs > Twcs (min.))
(2) Read modify Write
@ (Tcwd > Twwd(min.))
@ (Trwd > Trwd(min.))
(3) Fast Page Mode

DUT POWER SUPPLY

Programmable Range: 1.5V to 6.9V +/- 2%
Output Current: 2 Amp Maximum with resettable over current protection
TestMode: (1) Program from 1.5V to 6.9V
     (2) VBump: (1)4.7v to 5.3v (2) 4.5v to 5.5v

CURRENT MEASUREMENT DUT FAMILY TEST RANGE
(1) Operation Current (Icc 1) SRAM, DRAM 0-200 mA
SIMM, IC CARD 0-2000 mA
(2) Stand-by Current (Icc 2) All Types 1st: 0-2000uA
2nd: 0-200mA
(3) Data Retention Current (Idr) @ DUT Vcc=3.0 V; CE/=OE/=Vih CMOS SRAM 0-200uA
(4) Input leakage current DRAM, SIMM 1st: 0-20 uA
2nd: 0-200uA

OUTPUT LOADING TESTS
Programmable Dynamic Loading Range Programmable Output Threshold Voltage Range Number of Data I/O Without External Multiplexing
Sink Current (Iol):
      = 0.1 to 25 ma +/- 5%
Source Current (Ioh>:
     = - 0.1 ma to - 25 ma +/- 5% 		Logic LOW (Vol) = 0.1V to 1.2V
Logic HI (Voh) = 1.8V to 4.5V
 		18 Channels

CURRENT MEMORY ARCHITECTURES SUPPORTED
SRAM
    (4K, 16, 64K, 256K, 1M) x 1
    (1K, 4K, 16K, 64K, 256K) x4
    (2K, 8K, 32K, 128K, 256K, 512K) x8
DRAM
    (16K, 64K, 256K, 1M, 4M, 16M) x 1
    (16K, 64K, 256K, 1M, 4M) x 4
    2Mx8, 1Mx16
SIMM (30-PIN)
    (64K, 256K, 1M, 2M, 4M, 16M) x 8
    (64K, 256K, 1M, 2M, 4M, 16M) x 9
SIMM (72-PIN)
    (1M,2M,4M,8M) x 32
    (1M, 2M, 4M, 8M) x 33
    (256K, 512K, 1M, 2M, 4M, 8M) x 36
    (256K, 512K, 1M, 2M, 4M, 8M) x 40
JEIDA DRAM Card (88-PIN)
    1MB, 2MB, 4MB, 16MB, 32MB, With data bit of 32, 33, 36, and 40
PCMCIA SRAM Card (68-PIN)
    64KB, 128KB, 256KB, 512KB, 1MB, 2MB, 4MB
NOTE1: Some of the devices listed above may require a customized test fixture.
NOTE2: New memory architectures are constantly being developed. Contact IST for latest listing.

PHYSICAL SPECIFICATIONS
Peripheral Interface: RS-232 Serial Interface with auto baud rate & Handler Interface, active by negative going pulse or level
Dimensions & Shipping Weight: 4.5" High x 17.2" Wide x 16.5" Deep(ll.4 cm x 43.7 cm x 41.9 cm) 15 Lbs (6.81Kgs)
Power Requirements: 120V AC or 230V AC, +/- 10G/o 50 or 60 Hz, approximately 40W
Accessories furnished: Power cord and instrument manual
OPTIONS
  1. SRAM, DRAM, SIMM, Flash memory and IC card TestModules
  2. Socket adaptors for ZIP, SOJ, PLCC, SIP, and TSOP packages
  3. Any custom memory device or SIMM plug-in adaptors
  4. Test program for testing and sorting down-grade DRAM and ARAM
  5. DRAM Plug-in module with leakage current test
  6. Handler interface cable
  7. Automatic handler for SIMM of ICs
  8. PC interface software package for testing and diagnosing SIMM and IC cards

  • Return to the IST-6500 RAM Tester Page

    • About | Testing Machines | Household Electronics | Support | Site Map
    click on logo to go to IST home
    IST Logo - Small Information Scan Technology, Inc.
    487 Gianni St.
    Santa Clara, CA 95054
    USA
    +1.408.988.1908