Logic Scanmaster
(IST-5700D)

• With the Pin-to-Pin push button probing feature, each port has a Scope interface and Logic State display that allow simultaneous display of the waveform and logic state for each pin being probed

• On line DVM and logic Pulser / Probe with TTL or CMOS logic testing capability

• Up to four independent, 80 Channel ports for interfacing to QUAD, DLP, PLCC and SOJ devices

• Programmable or manual "Compare" feature allows real time or non-real time comparison of data from a "Known Good" board with data from a board under test, even on microprocessor based circuit boards

• Selected pin numbers of each device with programmed probing sequences can be stored in the battery back-up RAM for easy retrieval

THE IST-5700D Logic Scanmaster is equipped with either two or four independent interface ports that allow the connection of a multiplexcd Clip Probe to clip on ICs of up to 80 pins via an attached IC test clip. These clips can include QUAD, DIP, PLCC and SOJ types. Thus, any pin on the IC can be probed by manually keying in the desired pin number or by pressing the Up or Down heys to increment or decrement the current pin number. Pressing the Fast Scan key allows fast and automatic probing of all the pins within the defined pin mode. Combined with the Tri-State Level detector, this allows any broken PC board trace or circuit with driving problems to be easily detected and the pin number exhibiting the fault automatically displayed.

With the battery back-up RAM, all the selected test points of interest on a circuit board can be stored to control the probing sequences during the tests. This allows fast and easy probing of only selected test points either manually or automatically until the user has been guided through all of the programmed points. Each port is equipped with an LED Logic State Display and a Low Distortion, High Speed Real Time Oscilloscope Interface to allow it to continuously display the logic state and wave form of the signal present at the pin being probed while the corresponding pin number and analog voltage are displayed in the LCD display. Thus, signals from up to four different test points can be displayed and analyzed simultaneously.

Powerful "Compare" feature.

In "Compare Mode", non-real time and real time comparison can be selected with two timing tolerance settings. The IST-5700D can link two ports to allow synchronous probing on two boards simultaneously. The user connects one clip probe to a known good reference board and another clip probe to the identical location on the board under testing. This allows the automatic pin-to-pin comparison of a good reference board to a board under test based on either logic state or dynamic wave form. Also, microprocessor based circuit boards can be effectively diagnosed by connecting the CPU clocks and resetting the lines of the reference board and board-under-test together, synchronizing the two boards and allowing the "Compare" feature to be effectively applied. In the full JPEG image of the IST-5700D, the use of identical diagnostic EPROMs in the two synchronized boards would help to fully exercise the boards and greatly increase the efficiency and accuracy of the test.